EFF Related Works

	Technical Papers Wallace, Dolores R., Enhancing Competitiveness via a Public Fault & Failure Data Repository [postscript], The 3rd IEEE High-Assurance Systems Engineering Symposium, IEEE Computer Society, November 13-14, 1998, Washington, DC Wallace, Dolores R. and Mark LaRoy Zimmerman, "The EFFective Manager Tool," NISTIR 6137, Gaithersburg, MD April 1998. Hecht, Herbert and Dolores R. Wallace, "Toward More Effective Testing for High Assurance Systems", High Assurance Systems Engineering Conference, Washington, DC, 8/1997. Wallace, Dolores R., Laura M. Ippolito, Herbert Hecht, "Error, Fault, and Failure >Zta Collection and Analysis," Quality Week 97, San Francisco, May 27-30, 1997.

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	EXAMPLES OF DEFECT ANALYSIS at OTHER SITES *The National Software Quality Experiment conducted by Don O'Neill Consulting, collects core samples of software product quality in the Software Inspection lab. Distributions of fault types disocvered during the software inspection activity are provided with different views:
	year software process maturity level product organization programming language industry type

	*Orthogonal defect classification, or ODC, from IBM, is a scheme to capture the semantics of each software defect quickly. It is the definition and capture of defect attributes that make mathematical analysis and modeling possible. Analysis of ODC data provides a valuable diagnostics method for evaluating the various phases of the software life cycle (design, development, test and service) and the maturity of the product. Charts are presented of defect classes that have been discovered with triggers (specific types of problems) used with various discovery activities throughout the lifecycle.

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Technical Papers